Non-stoichiometry and its implications for the properties of PMN–PT thin filmsElectronic supplementary information (ESI) available: See supplementary data for: values extracted from XRD data, AFM images of the samples' surface and STEM cross-sections of the LNO layer. See DOI: https://doi.org/10.1039/d2tc04070k
In: Journal of materials chemistry.C, Jg. 11 (2023), Heft 3, S. 1144-1154
serialPeriodical
Zugriff:
Titel: |
Non-stoichiometry and its implications for the properties of PMN–PT thin filmsElectronic supplementary information (ESI) available: See supplementary data for: values extracted from XRD data, AFM images of the samples' surface and STEM cross-sections of the LNO layer. See DOI: https://doi.org/10.1039/d2tc04070k
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Autor/in / Beteiligte Person: | Trstenjak, Urška ; Daneu, Nina ; Belhadi, Jamal ; Samardžija, Zoran ; Matavž, Aleksander ; Bobnar, Vid ; Koster, Gertjan ; Spreitzer, Matjaž |
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Zeitschrift: | Journal of materials chemistry.C, Jg. 11 (2023), Heft 3, S. 1144-1154 |
Veröffentlichung: | 2023 |
Medientyp: | serialPeriodical |
ISSN: | 2050-7526 (print) |
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