Thermal degradation comparison of delta-doped GaAs tunnel junctions using Si and Te n-type dopants
In: AIP advances, Jg. 13 (2023), Heft 4
Online
serialPeriodical
Zugriff:
Titel: |
Thermal degradation comparison of delta-doped GaAs tunnel junctions using Si and Te n-type dopants
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Autor/in / Beteiligte Person: | Madarang, May Angelu ; Chu, Rafael Jumar ; Kim, Yeonhwa ; Lung, Quang Nhat Dang ; Ju, Eunkyo ; Choi, Won Jun ; Jung, Daehwan |
Link: | |
Zeitschrift: | AIP advances, Jg. 13 (2023), Heft 4 |
Veröffentlichung: | 2023 |
Medientyp: | serialPeriodical |
ISSN: | 2158-3226 (print) |
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