Analysis of interstrip capacitance of p+n MCz Si microstrip detector using TCAD simulation combining surface and bulk damage effects by mixed irradiation
In: Radiation effects and defects in solids, Jg. 178 (2023), Heft 7-8, S. 990-1011
Online
serialPeriodical
Zugriff:
Titel: |
Analysis of interstrip capacitance of p+n MCz Si microstrip detector using TCAD simulation combining surface and bulk damage effects by mixed irradiation
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Autor/in / Beteiligte Person: | Kaur, Balwinder ; Patyal, Shilpa ; Chatterjee, Puspita ; Srivastava, Ajay K. |
Link: | |
Zeitschrift: | Radiation effects and defects in solids, Jg. 178 (2023), Heft 7-8, S. 990-1011 |
Veröffentlichung: | 2023 |
Medientyp: | serialPeriodical |
ISSN: | 1042-0150 (print) |
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