Automated In-Situ Monitoring for Variability-Resilient and Energy-Efficient Digital Circuits Demonstrated on a Viterbi Decoder in 22-nm CMOS
In: IEEE transactions on very large scale integration (VLSI) systems, Jg. 31 (2023), Heft 9, S. 1320-1329
Online
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Zugriff:
Titel: |
Automated In-Situ Monitoring for Variability-Resilient and Energy-Efficient Digital Circuits Demonstrated on a Viterbi Decoder in 22-nm CMOS
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Autor/in / Beteiligte Person: | Nieto Taladriz, Clara ; Dehaene, Wim |
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Zeitschrift: | IEEE transactions on very large scale integration (VLSI) systems, Jg. 31 (2023), Heft 9, S. 1320-1329 |
Veröffentlichung: | 2023 |
Medientyp: | serialPeriodical |
ISSN: | 1063-8210 (print) |
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