Sol gel TiO2antireflection coatings for Silicon solar cells

Purpose: The aim of this paper was to investigate changes in surface morphology and optical reflection of thin films of titanium dioxide. Thin films were prepared using sol gel spin coating method. Design/methodology/approach: The microanalysis have been investigated by the Energy-dispersive X-ray spectroscopy EDS. The changes in surface topography was observed by the atomic force microscope AFM and scanning electron microscope SEM. The results of roughness have been prepared in the software XEI Park Systems and optical reflection by the spectrometer UV/VIS. Findings: Results and their analysis allow to conclude that the titanium isopropoxide concentration in solution and spin speed, which is an important factor in spin coating technology has a significant influence on surface morphology and optical reflection of thin films titanium dioxide. Practical implications: Known sol gel titanium dioxide optical parameters and the possibility of obtaining a uniform thin films show that it can be good material for photovoltaic application. Originality/value: The paper presents some researches of titanium dioxide thin films deposited by sol gel spin coating method on monocrystalline silicon.