Characterization of picosecond electric-pulse propagation on CPW components by transient near-field mapping
In: IEEE transactions on advanced packaging, Jg. 25 (2002), Heft 3, S. 459-466
Online
academicJournal
- print, 17 ref
Zugriff:
For the first time, the picosecond electric-pulse propagation characteristics of a few coplanar waveguide (CPW) components, including transmission lines, capacitive open and short terminations and a right-angle bend, have been successfully measured by mapping the time-dependent tangential near-electric-field distributions. The measurement was performed using a two-dimensional photoconductive (PC) near-field mapping system incorporating a recently developed novel PC electric-field probe, which could measure the separate picosecond orthogonal electric-field components with minimal loading effects. The resulting field-images mapped over the structural capacitive open termination and the short termination, showed previously unknown, and quite remarkable, transient picosecond electric-pulse reflection phenomena, which cannot be measured using conventional test instruments. In addition, the images showed that reflection-phenomenon itself required about 1 ps of propagation delay, and that the pulse-reflection from the capacitive open-termination required additional time delay matched to the length of the open-gap between the two slots of the CPW. We also found that at a CPW right-angle bend, comparable part of the energy of the guided signal leaks from the bend to the outer ground plane as radiating energy, and that two series-connected CPW discontinuities can remove the coupled-slotline mode generated at one of the discontinuities without using any additional component, such as an air-bridge.
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Characterization of picosecond electric-pulse propagation on CPW components by transient near-field mapping
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Autor/in / Beteiligte Person: | JONGJOO, LEE ; SUNGKYU, YU ; JOUNGHO, KIM |
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Zeitschrift: | IEEE transactions on advanced packaging, Jg. 25 (2002), Heft 3, S. 459-466 |
Veröffentlichung: | Piscataway, NY: Institute of Electrical and Electronics Engineers, 2002 |
Medientyp: | academicJournal |
Umfang: | print, 17 ref |
ISSN: | 1521-3323 (print) |
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