Distinguishing metastable changes in bulk CIGS defect densities from interface effects
In: Proceedings of the Symposium B, Thin Film Chalcogenide Photovoltaic Materials, E-MRS Spring Meeting, Strasbourg, France, June 18-21, 2002Thin solid films 431-32:426-430; Jg. 431-32 (2003) S. 426-430
Konferenz
- print, 14 ref
Zugriff:
The deep defect distributions affecting majority carrier trapping in polycrystalline CuIn1-xGaxSe2 (CIGS) have been studied using drive level capacitance profiling. This technique provides, a spatial and energetic profile of sub-band gap defect transitions in the CIGS layer of working photovoltaic devices, while remaining insensitive to surface states. The bulk response was dominated by a defect which varied between 0.1 and 0.3 eV, according to the Meyer-Neldel rule. Devices grown at reduced substrate temperatures had smaller grain sizes and additional defect response. The effect of a light-soaking treatment, using near-band gap optical excitation, was studied. Both the free carrier density and the density of deeper defects were increased by this treatment. Device quality was degraded, predominantly due to a decreased fill factor.
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Distinguishing metastable changes in bulk CIGS defect densities from interface effects
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Autor/in / Beteiligte Person: | HEATH, J. T ; COHEN, J. D ; SHAFARMAN, W. N |
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Quelle: | Proceedings of the Symposium B, Thin Film Chalcogenide Photovoltaic Materials, E-MRS Spring Meeting, Strasbourg, France, June 18-21, 2002Thin solid films 431-32:426-430; Jg. 431-32 (2003) S. 426-430 |
Veröffentlichung: | Lausanne: Elsevier Science, 2003 |
Medientyp: | Konferenz |
Umfang: | print, 14 ref |
ISSN: | 0040-6090 (print) |
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