Sol-gel derived LaNiO3 thin films on ZrO2-buffered (100) Si substrates
In: 3rd Asian Meeting on ElectroceramicsCeramics international 30(7):1253-1256; Jg. 30 (2004) 7, S. 1253-1256
Konferenz
- print, 17 ref
Zugriff:
Perovskite LaNiO3 (LNO) thin films with a strong (10 0)-orientation were fabricated on yttrium-stabilized-zirconia (YSZ)-buffered silicon substrates using a sol-gel method. The YSZ buffer layer showed a stable tetragonal phase, and proved to be effective to suppress inter-diffusion between the Si substrates and the LNO films. Our obtained LNO films on the YSZ buffer layer exhibited a homogenous and smooth surface, with an average grain size below 0.1 μm. The resistivity of the LNO films was in the magnitude order of 10-4 Ω cm. The crystallographic orientation and low resistivity make the sol-gel derived LNO films very attractive as the bottom electrode layer for perovskite oxide ceramic thin films.
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Sol-gel derived LaNiO3 thin films on ZrO2-buffered (100) Si substrates
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Autor/in / Beteiligte Person: | SHUHUI, YU ; KUI, YAO ; TAY ENG HOCK, Francis |
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Quelle: | 3rd Asian Meeting on ElectroceramicsCeramics international 30(7):1253-1256; Jg. 30 (2004) 7, S. 1253-1256 |
Veröffentlichung: | Kidlington: Elsevier Science, 2004 |
Medientyp: | Konferenz |
Umfang: | print, 17 ref |
ISSN: | 0272-8842 (print) |
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