Structural characterization of porous film materials and the supported metal catalysts by synchrotron powder X-ray diffraction
In: Advanced methods in characterization of catalysts and materialsCatalysis today 97(1):55-61; Jg. 97 (2004) 1, S. 55-61
Konferenz
- print, 17 ref
Zugriff:
Synchrotron powder X-ray diffraction (PXRD) was applied to the structural characterization of microporous and mesoporous materials as well as their supported metal catalysts. Advantages of synchrotron X-ray powder diffraction are illustrated by the detection of the MFI crystalline phase on the non-smooth surface of a microporous MFI film supported on the inner wall of a ceramic hollow tube, and of the formation of Au and Pt nano-particles in powdery mesoporous materials.
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Structural characterization of porous film materials and the supported metal catalysts by synchrotron powder X-ray diffraction
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Autor/in / Beteiligte Person: | SHEU, Hwo-Shuenn ; LIU, Pang-Hung ; CHENG, Hsin-Ling ; CHAO, Kuei-Jung ; CHANG, Yen-Po |
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Quelle: | Advanced methods in characterization of catalysts and materialsCatalysis today 97(1):55-61; Jg. 97 (2004) 1, S. 55-61 |
Veröffentlichung: | Amsterdam: Elsevier Science, 2004 |
Medientyp: | Konferenz |
Umfang: | print, 17 ref |
ISSN: | 0920-5861 (print) |
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