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The evolution of surface and interface roughness during heteroepitaxial growth of strained BaTiO3/LaNiO3(BTO/ LNO) superlattices on SrTiO3 (001) substrates was investigated using real-time X-ray reflectivity measurements in situ with synchrotron radiation. The roughness scaling of the growth front and interface of superlattices with modulation length below (2 and 6 nm) and beyond (20 nm) the critical thickness was studied against the bilayer number. The fitted results of in situ specular X-ray reflectivity curves reveal a two-dimensional growth of BTO and LNO sublayers on the SrTiO3 substrate for superlattices with a modulation length below the critical thickness. Moreover, a larger root-mean-square roughness of BTO/LNO interface was obtained in the superlattice with modulation length beyond the critical thickness indicating lattice relaxation in the superlattice structure. Fitted results of in situ specular X-ray reflectivity curves provide the first evidence for power-law scaling of the root-mean-square roughness of an interface and a surface in the superlattice structure. Observation of such a roughness scaling behavior indicates that strain plays an important role in the determination of microstructure in the growth of epitaxial BTO/LNO superlattices.

Titel:	Real-time X-ray study of roughness scaling in the initial growth of epitaxial BaTiO3/LaNiO3 superlattices
Autor/in / Beteiligte Person:	LIANG, Yuan-Chang ; LEE, Hsin-Yi ; LIU, Heng-Jui ; HUANG, Chun-Kai ; WU, Tai-Bor
Link:	E-Journal im Bestand der UB Hagen? View record from PASCAL Archive
Zeitschrift:	Journal of crystal growth, Jg. 279 (2005), Heft 1-2, S. 114-121
Veröffentlichung:	Amsterdam: Elsevier, 2005
Medientyp:	academicJournal
Umfang:	print, 38 ref
ISSN:	0022-0248 (print)
Schlagwort:	Crystallography Cristallographie cristallogenèse Geology Géologie Metallurgy, welding Métallurgie, soudage Sciences exactes et technologie Exact sciences and technology Physique Physics Etat condense: structure, proprietes mecaniques et thermiques Condensed matter: structure, mechanical and thermal properties Surfaces et interfaces; couches minces et trichites (structure et propriétés non électroniques) Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Surfaces solides et interfaces solide-solide Solid surfaces and solid-solid interfaces Structure et rugosité d'interface Interface structure and roughness Structure et morphologie de couches minces Thin film structure and morphology Structure et morphologie; épaisseur Structure and morphology; thickness Composé minéral Inorganic compounds Lanthanide composé Rare earth compounds Métal transition composé Transition element compounds Baryum titanate Barium titanates Couche mince Thin films Couche épitaxique Epitaxial layers Epaisseur Thickness Etude expérimentale Experimental study Interface Interfaces Lanthane oxyde Lanthanum oxides Microscopie force atomique Atomic force microscopy Mode empilement Stacking sequence Modo apilamiento Morphologie Morphology Nickel oxyde Nickel oxides Orientation cristalline Crystal orientation Rugosité Roughness Spectre réflexion Reflection spectrum Espectro reflexión Structure lamellaire Lamellar structure Estructura lamelar Superréseau Superlattices Temps réel Real time Tiempo real Ba O Ti BaTiO3 La Ni O LaNiO3 Substrat SrTiO3 68.10.Kw 68.10.Nz 68.55.Jk A1. Surface structure A1. X-ray diffraction A3. Superlattices
Sonstiges:	Nachgewiesen in: PASCAL Archive Sprachen: English Original Material: INIST-CNRS Document Type: Article File Description: text Language: English Author Affiliations: Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Tawain, Province of China ; National Synchrotron Radiation Research Center, 101 Hsin-Ann Road, Hsinchu Science Park, Hsmchu 30076, Tawain, Province of China Rights: Copyright 2005 INIST-CNRS ; CC BY 4.0 ; Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS Notes: Physics of condensed state: structure, mechanical and thermal properties

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Real-time X-ray study of roughness scaling in the initial growth of epitaxial BaTiO3/LaNiO3 superlattices