Transverse correlations and plasticity in the CDW conductor NbSe3 studied by X-ray microbeam diffraction
In: International workshop on electronic crystals ECRYS-2005Journal de physique. IV 131:139-142
Konferenz
- print, 8 ref
Zugriff:
In whisker-like samples of the quasi-1D conductor NbSe3, the presence of longitudinal steps causes shearing of the CDW, and leads to a loss of transverse correlations. We use a microdiffraction setup with a spatial resolution of 300 nm and an angular sensitivity of 5 mdeg to image the resulting CDW contrast between thick and thin portions of the sample. Microdiffraction in the b* - c* plane shows that depinning on the thick, weakly pinned side is accompanied by the loss of diffraction intensity, demonstrating a loss of correlations in qualitative agreement with previous X-ray diffraction topography measurements1, but with an order-of-magnitude improvement in spatial resolution. Microdiffraction images in the a* - b* plane reveal a sharp increase in the full width at half maximum in an approximately 1 micron thick region near the step edge and a rotation of the CDW wavevector that varies with applied field. We use the extremal value of the CDW wavevector rotation to estimate the shear modulus of this electronic crystal.
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Transverse correlations and plasticity in the CDW conductor NbSe3 studied by X-ray microbeam diffraction
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Autor/in / Beteiligte Person: | ISAKOVIC, A. F ; EVANS, P. G ; CAI, Z ; LAI, B ; KMETKO, J ; CICAK, K ; THORNE, R. E |
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Quelle: | International workshop on electronic crystals ECRYS-2005Journal de physique. IV 131:139-142 |
Veröffentlichung: | Les Ulis: EDP sciences, 2005 |
Medientyp: | Konferenz |
Umfang: | print, 8 ref |
ISSN: | 1155-4339 (print) |
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