Low temperature amorphous and nanocrystalline silicon thin film transistors deposited by Hot-Wire CVD on glass substrate
In: Proceedings of the Third International Conference on Hot-Wire CVD (Cat-CVD) Process, Utrecht, The Netherlands, August 23-27, 2004Thin solid films 501(1-2):303-306; Jg. 501 (2006) 1-2, S. 303-306
Konferenz
- print, 8 ref
Zugriff:
Amorphous and nanocrystalline silicon films obtained by Hot-Wire Chemical Vapor Deposition have been incorporated as active layers in n-type coplanar top gate thin film transistors deposited on glass substrates covered with SiO2. Amorphous silicon devices exhibited mobility values of 1.3 cm2 V-1 s-1, which are very high taking into account the amorphous nature of the material. Nanocrystalline transistors presented mobility values as high as 11.5 cm2 V-1 s-1 and resulted in low threshold voltage shift (∼0.5 V).
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Low temperature amorphous and nanocrystalline silicon thin film transistors deposited by Hot-Wire CVD on glass substrate
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Autor/in / Beteiligte Person: | FONRODONA, M ; SOLER, D ; ESCARRE, J ; VILLAR, F ; BERTOMEU, J ; ANDREU, J ; SABOUNDJI, A ; COULON, N ; MOHAMMED-BRAHIM, T |
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Quelle: | Proceedings of the Third International Conference on Hot-Wire CVD (Cat-CVD) Process, Utrecht, The Netherlands, August 23-27, 2004Thin solid films 501(1-2):303-306; Jg. 501 (2006) 1-2, S. 303-306 |
Veröffentlichung: | Lausanne: Elsevier Science, 2006 |
Medientyp: | Konferenz |
Umfang: | print, 8 ref |
ISSN: | 0040-6090 (print) |
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