An active magnetic probe array for the multiple-point concurrent measurement of electromagnetic emissions
In: Selected papers from the International Magnetics Conference (Intermag 2006), San Diego, California, May 8-12, 2006IEEE transactions on magnetics 42(10):3303-3305
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Konferenz
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Zugriff:
In order to diagnose the EMI (Electromagnetic Interference) problem of ICs, an integrated active magnetic probe array has been developed in SOI (Silicon On Insulator)-CMOS technology. Three aligned differential coils, differential amplifiers, a differential to single-ended converter, an output buffer and bias circuits are all integrated in a single-chip. A measurement result shows that the probe achieves an e-field suppression ratio of 33.6 dB at 50 MHz. Furthermore, a two-dimensional magnetic field distribution map is drawn by the probe array using the 3-point concurrent measurement. The obtained image gains three times higher resolution than that of a single scan under an identical condition.
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An active magnetic probe array for the multiple-point concurrent measurement of electromagnetic emissions
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Autor/in / Beteiligte Person: | AOYAMA, Satoshi ; KAWAHITO, Shoji ; YAMAGUCHI, Masahiro |
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Quelle: | Selected papers from the International Magnetics Conference (Intermag 2006), San Diego, California, May 8-12, 2006IEEE transactions on magnetics 42(10):3303-3305 |
Veröffentlichung: | New York, NY: Institute of Electrical and Electronics Engineers, 2006 |
Medientyp: | Konferenz |
Umfang: | print, 7 ref |
ISSN: | 0018-9464 (print) |
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