Fabrication and Characteristics of 40-Gb/s Traveling-Wave Electroabsorption Modulator-Integrated DFB Laser Modules
In: IEEE transactions on advanced packaging, Jg. 31 (2008), Heft 2, S. 351-356
Online
academicJournal
- print, 21 ref
Zugriff:
We have developed 40-Gb/s traveling-wave electroabsorption-modulator-integrated distributed feedback laser (TW-EML) modules using several advanced technologies. First, we have adopted a selective area growth (SAG) method in the fabrication of the 40-Gb/s EML device to provide active layers for the laser and the electroabsorption modulators (EAMs) simultaneously. The fabricated device shows that the measured 3-dB bandwidth of electrical-to-optical (E/O) response reaches about 45 GHz and the return loss (S11) is kept below -10 dB up to 50 GHz. For the module design of the device, we mainly considered electrical and optical factors. The measured S11 of the fabricated 40 Gb/s TW-EML module is below -10 dB up to about 30 GHz and the 3-dB bandwidth of the E/O response reaches over 35 GHz. We also have developed two types of coplanar waveguide (CPW) for the application of the driver amplifier integrated 40 Gb/s TW-EML module, which is a system-on-package (SoP) composed of an EML device and a driver amplifier device in a module. The measured S11 of the two-step-bent CPW is below -10 dB up to 35 GHz and the measured S11 of the parallel type CPW is below -10 dB up to 39 GHz.
Titel: |
Fabrication and Characteristics of 40-Gb/s Traveling-Wave Electroabsorption Modulator-Integrated DFB Laser Modules
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Autor/in / Beteiligte Person: | YUN, Ho-Gyeong ; CHOI, Kwang-Seong ; KWON, Yong-Hwan ; CHOE, Joong-Seon ; MOON, Jong-Tae |
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Zeitschrift: | IEEE transactions on advanced packaging, Jg. 31 (2008), Heft 2, S. 351-356 |
Veröffentlichung: | Piscataway, NY: Institute of Electrical and Electronics Engineers, 2008 |
Medientyp: | academicJournal |
Umfang: | print, 21 ref |
ISSN: | 1521-3323 (print) |
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