A high resolution Poly-Si TFT-LCD employing analog sample and hold driver
In: Displays, Jg. 29 (2008), Heft 5, S. 497-501
academicJournal
- print, 7 ref
Zugriff:
In this study, we have developed high performance TFT (thin film transistor) and a 7.4-inch high resolution LCD (liquid crystal display) panel of full color WSXGA (1600 x RGB x 1024, 257 ppi, 43% aperture ratio) format using 'sequential lateral solidification (SLS)' laser crystallization process [Y.J. Kim et al., Grain boundary effect on the characteristics of the high-performance poly-Si TFTs crystallized by SLS Technique, AM-LCD (2005) 249-251]. The gate and data driver circuits were integrated on panel and the integrated drivers comprise a sequential analog sampling data driver and a dual logic gate scanner for redundancy. In addition, we have improved key process for fine image quality. Metal lines used Cu/MoX (5000 Å/ 300 Å) for uniform data transfer and array on BM (black matrix) structure for lager aperture ratio was adopted.
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A high resolution Poly-Si TFT-LCD employing analog sample and hold driver
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Autor/in / Beteiligte Person: | KYOUNG MOON, LIM ; LEE, Kyungeon ; KANG, Hochul ; KIM, Chang-Dong ; DEUK SU, LEE ; KANG, In-Byung ; MYOUNG KEE, BAEK ; BU YEOL, LEE ; SONG, In-Hyuk ; YU, Jae-Sung ; LEE, Hye-Jin ; KWANG HO, JANG ; PARK, Yong-In ; YONG SU, YOO |
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Zeitschrift: | Displays, Jg. 29 (2008), Heft 5, S. 497-501 |
Veröffentlichung: | Amsterdam: Elsevier, 2008 |
Medientyp: | academicJournal |
Umfang: | print, 7 ref |
ISSN: | 0141-9382 (print) |
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