Dielectric functions and the interband critical points of InAs0.05Sb0.95 film grown by a modified LPE technique
In: Physica. B, Condensed matter, Jg. 405 (2010), Heft 1, S. 227-230
academicJournal
- print, 17 ref
Zugriff:
InAs0.05Sb0.95 film with thickness of 700 μm has been grown by a modified LPE technique, and optical properties of the material have been investigated using spectroscopic-ellipsometry at room temperature within 1.5-4.5 eV. The dielectric function ε(E) spectra that show high-lying interband structure associated with E1, E1+Δ1, and E2 transition have been observed and analyzed on the basis of a simplified model of the interband transitions. Results agree satisfactorily with the experimental data over the entire range of photon energies. The transition energies E1 and E2, the spin-orbit splitting energy Δ1, and the broadening parameters are given, respectively.
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Dielectric functions and the interband critical points of InAs0.05Sb0.95 film grown by a modified LPE technique
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Autor/in / Beteiligte Person: | HU, S. H ; YU, G. L ; GE, J ; WANG, R ; SUN, Y ; WU, J ; WANG, Q. W ; DAI, N |
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Zeitschrift: | Physica. B, Condensed matter, Jg. 405 (2010), Heft 1, S. 227-230 |
Veröffentlichung: | Kidlington: Elsevier, 2010 |
Medientyp: | academicJournal |
Umfang: | print, 17 ref |
ISSN: | 0921-4526 (print) |
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