Loss Measurement of Aluminum Thin-Film Coplanar Waveguide (CPW) Lines at Microwave Frequencies
In: I.E.E.E. transactions on electron devices, Jg. 57 (2010), Heft 8, S. 2037-2040
Online
academicJournal
- print, 9 ref
Zugriff:
To investigate coplanar waveguide (CPW) attenuation in monolithic microwave integrated circuits, measurements are carried out within 15-26 GHz on several CPW resonators with different metal thicknesses ranging from 200 to 2300 nm. In these experiments, the thin metal layers are made of aluminum. We will present a method for extracting the quality factor from the measured S-parameters of the CPW resonators.
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Loss Measurement of Aluminum Thin-Film Coplanar Waveguide (CPW) Lines at Microwave Frequencies
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Autor/in / Beteiligte Person: | RAMAZANI, Maliheh ; MILADI, Haddad ; SHAHABADI, Mahmoud ; MOHAJERZADEH, Shamsoddin |
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Zeitschrift: | I.E.E.E. transactions on electron devices, Jg. 57 (2010), Heft 8, S. 2037-2040 |
Veröffentlichung: | New York, NY: Institute of Electrical and Electronics Engineers, 2010 |
Medientyp: | academicJournal |
Umfang: | print, 9 ref |
ISSN: | 0018-9383 (print) |
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