Electromagnetic Compatibility Benchmark-Modeling Approach for a Dual-Die CPU
In: IEEE transactions on electromagnetic compatibility, Jg. 53 (2011), Heft 1, S. 91-98
Online
academicJournal
- print, 12 ref
Zugriff:
The traditional challenging problem 2000-4 of electromagnetics (as indicated by the IEEE) proposed a benchmark model of a conventional CPU with a heatsink. However, after CPU entered the multiple-die century, the original model is no longer effective for the new generation multiple-die package. A novel model is proposed in this paper for electromagnet radiation modeling of the CPU with dual dies as a new electromagnetic compatibility benchmark-modeling approach. The modeling method is validated by the measurement, and the simulation and measurement results showed a good agreement, and demonstrated it is an effective modeling technique.
Titel: |
Electromagnetic Compatibility Benchmark-Modeling Approach for a Dual-Die CPU
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Autor/in / Beteiligte Person: | BOYUAN, ZHU ; JUNWEI, LU ; ERPING, LI |
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Zeitschrift: | IEEE transactions on electromagnetic compatibility, Jg. 53 (2011), Heft 1, S. 91-98 |
Veröffentlichung: | New York, NY: Institute of Electrical and Electronics Engineers, 2011 |
Medientyp: | academicJournal |
Umfang: | print, 12 ref |
ISSN: | 0018-9375 (print) |
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