Structure of (001) GaAs surfaces during epitaxial growth by organometallic chemical vapor deposition
In: Applied physics letters, Jg. 63 (1993), Heft 23, S. 3206-3208
Online
academicJournal
- print, 13 ref
Zugriff:
Under typical atmospheric pressure (AP) organometallic chemical vapor deposition (OMCVD) growth conditions with trimethylgallium (TMG) and arsine sources, reflectance-difference (RD) spectra show that the (001) GaAs surface is in the d(4×4)-like state. With sufficiently high TMG and low AsH3 exposures, we observe RD spectra similar to those obtained during atomic layer epitaxy (ALE) at lower temperatures.
Titel: |
Structure of (001) GaAs surfaces during epitaxial growth by organometallic chemical vapor deposition
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Autor/in / Beteiligte Person: | KAMIYA, I ; TANAKA, H ; ASPNES, D. E ; KOZA, M ; BHAT, R |
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Zeitschrift: | Applied physics letters, Jg. 63 (1993), Heft 23, S. 3206-3208 |
Veröffentlichung: | Melville, NY: American Institute of Physics, 1993 |
Medientyp: | academicJournal |
Umfang: | print, 13 ref |
ISSN: | 0003-6951 (print) |
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