Deposition condition of epitaxially grown PZT films by CVD
In: Nippon seramikkusu kyokai gakujutsu ronbunshi, Jg. 102 (1994), Heft 8, S. 795-798
academicJournal
- print, 13 ref
Zugriff:
Epitaxially grown Pb(Zr,Ti)O3 [PZT] films were deposited on (100) MgO substrates by CVD and the effects of deposition parameters on the epitaxial growth of the films were investigated. The films consisting of PZT single phases were deposited from about 0.4 to 0.5 of Pb/(Pb + Zr + Ti) and the epitaxially grown film was obtained near 0.5 of Pb/(Pb + Zr + Ti). Epitaxially grown PZT films were deposited over wide deposition conditions; 600-700°C of the deposition temperature, 1.1-6.7 kPa of the total gas pressure and 64 Pa-1.1 kPa of the oxygen partial pressure.
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Deposition condition of epitaxially grown PZT films by CVD
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Autor/in / Beteiligte Person: | FUNAKUBO, H ; IMASHITA, K ; MATSUYAMA, K ; SHINOZAKI, K ; MIZUTANI, N |
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Zeitschrift: | Nippon seramikkusu kyokai gakujutsu ronbunshi, Jg. 102 (1994), Heft 8, S. 795-798 |
Veröffentlichung: | Tokyo: Nippon seramikkusu kyokai, 1994 |
Medientyp: | academicJournal |
Umfang: | print, 13 ref |
ISSN: | 0914-5400 (print) |
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