Critical behavior of the electron-spin-resonance linewidth in multilayered Cu0.89Mn0.11/Cu spin glasses
In: Physical review. B, Condensed matter, Jg. 46 (1992), Heft 14, S. 9254-9257
Online
academicJournal
- print, 38 ref
Zugriff:
The temperature dependence of the electron-spin-resonance linewidth, ΔH(T), has been measured in multilayered Cu0.89Mn0.11/Cu as a function of spin-glass layer thickness WSG with 1 nm≤WSG≤500 nm. We find that the critical behavior, as characterized by the divergence strength C and exponent k changes systematically with WSG.
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Critical behavior of the electron-spin-resonance linewidth in multilayered Cu0.89Mn0.11/Cu spin glasses
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Autor/in / Beteiligte Person: | LESLIE-PELE, D. L ; COWEN, J. A |
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Zeitschrift: | Physical review. B, Condensed matter, Jg. 46 (1992), Heft 14, S. 9254-9257 |
Veröffentlichung: | Woodbury, NY; Woodbury, NY: American Institute of Physics, American Physical Society, 1992 |
Medientyp: | academicJournal |
Umfang: | print, 38 ref |
ISSN: | 0163-1829 (print) |
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