PSP Model-Based Emulation Method for Geometry-Dependent Cryogenic Effects in 28-nm Bulk CMOS Technology.
In: ICEIC; (2024) S. 1-3
Konferenz
Zugriff:
Titel: |
PSP Model-Based Emulation Method for Geometry-Dependent Cryogenic Effects in 28-nm Bulk CMOS Technology.
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Autor/in / Beteiligte Person: | Yi, Seunghoon ; Joo, Hee-Cheol ; Seung Chae Jung ; Kim, Yoochang ; Hwang, Young-Ha |
Link: | |
Quelle: | ICEIC; (2024) S. 1-3 |
Veröffentlichung: | 2024 |
Medientyp: | Konferenz |
DOI: | 10.1109/ICEIC61013.2024.10457168 |
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