Extracting and Analyzing the S-Parameters of Vertical Interconnection Structures in 3D Glass Packaging
In: Micromachines, Jg. 14 (2023-03-01), Heft 4, S. 803-803
Online
academicJournal
Zugriff:
In order to effectively employ through-glass vias (TGVs) for high-frequency software package design, it is crucial to accurately characterize the S-parameters of vertical interconnection structures in 3D glass packaging. A methodology is proposed for the extraction of precise S-parameters using the transmission matrix (T-matrix) to analyze and evaluate the insertion loss (IL) and reliability of TGV interconnections. The method presented herein enables the handling of a diverse range of vertical interconnections, encompassing micro-bumps, bond-wires, and a variety of pads. Additionally, a test structure for coplanar waveguide (CPW) TGVs is constructed, accompanied by a comprehensive description of the equations and measurement procedure employed. The outcomes of the investigation demonstrate a favorable concurrence between the simulated and measured results, with analyses and measurements conducted up to 40 GHz.
Titel: |
Extracting and Analyzing the S-Parameters of Vertical Interconnection Structures in 3D Glass Packaging
|
---|---|
Autor/in / Beteiligte Person: | Liu, Jinxu ; Zhang, Jihua ; Gao, Libin ; Chen, Hongwei |
Link: | |
Zeitschrift: | Micromachines, Jg. 14 (2023-03-01), Heft 4, S. 803-803 |
Veröffentlichung: | MDPI AG, 2023 |
Medientyp: | academicJournal |
ISSN: | 2072-666X (print) |
DOI: | 10.3390/mi14040803 |
Schlagwort: |
|
Sonstiges: |
|