A direct experimental comparison of single-crystal CVD diamond and silicon carbide X-ray beam position monitors
In: Journal of Synchrotron Radiation, Jg. 30 (2023), Heft 5, S. 876-884
Online
academicJournal
Zugriff:
Single-crystal chemical vapour deposition (CVD) diamond detectors are an established transmissive synchrotron beamline diagnostic instrument used for beam position and beam intensity monitoring. A recently commercialized alternative is silicon carbide (4H-SiC) devices. These have the potential to provide the same diagnostic information as commercially available single-crystal CVD diamond X-ray beam position monitors, but with a much larger transmissive aperture. At Diamond Light Source an experimental comparison of the performance of single-crystal CVD diamond and 4H-SiC X-ray beam position monitors has been carried out. A quantitative comparison of their performance is presented in this paper. The single-crystal diamond and 4H-SiC beam position monitors were installed in-line along the synchrotron X-ray beam path enabling synchronous measurements at kilohertz rates of the beam motion from both devices. The results of several tests of the two position monitors' performance are presented: comparing signal uniformity across the surface of the detectors, comparing kHz intensity measurements, and comparing kHz beam position measurements from the detectors. Each test is performed with a range of applied external bias voltages. A discussion of the benefits and limitations of 4H-SiC and single-crystal CVD diamond detectors is included.
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A direct experimental comparison of single-crystal CVD diamond and silicon carbide X-ray beam position monitors
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Autor/in / Beteiligte Person: | Houghton, C. ; Bloomer, C. ; Bobb, L. |
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Zeitschrift: | Journal of Synchrotron Radiation, Jg. 30 (2023), Heft 5, S. 876-884 |
Veröffentlichung: | International Union of Crystallography, 2023 |
Medientyp: | academicJournal |
ISSN: | 1600-5775 (print) |
DOI: | 10.1107/S1600577523005623 |
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