SSCT-Net: A Semisupervised Circular Teacher Network for Defect Detection With Limited Labeled Multiview MFL Samples
In: IEEE Transactions on Industrial Informatics, Jg. 19 (2023-10-01), Heft 10, S. 10114-10124
Online
academicJournal
Zugriff:
Titel: |
SSCT-Net: A Semisupervised Circular Teacher Network for Defect Detection With Limited Labeled Multiview MFL Samples
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Autor/in / Beteiligte Person: | Shen, X. ; Liu, J. ; Sun, J. ; Jiang, L. ; Zhao, H. ; Zhang, H. |
Link: | |
Zeitschrift: | IEEE Transactions on Industrial Informatics, Jg. 19 (2023-10-01), Heft 10, S. 10114-10124 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 1551-3203 (print) ; 1941-0050 (print) |
DOI: | 10.1109/TII.2022.3232764 |
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