Gate-to-drain/source overlap and asymmetry effects on hot-carrier generation
In: IEEE International Integrated Reliability Workshop (IIRW); (2022-10-09) S. 1-5
Konferenz
Zugriff:
Titel: |
Gate-to-drain/source overlap and asymmetry effects on hot-carrier generation
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Autor/in / Beteiligte Person: | Devoge, P. ; Aziza, H. ; Lorenzini, P. ; Masson, P. ; Julien, F. ; Marzaki, A. ; Malherbe, A. ; Delalleau, J. ; Cabout, T. ; Regnier, A. ; Niel, S. |
Quelle: | IEEE International Integrated Reliability Workshop (IIRW); (2022-10-09) S. 1-5 |
Veröffentlichung: | 2022 |
Medientyp: | Konferenz |
ISBN: | 978-1-6654-5368-4 (print) |
ISSN: | 2374-8036 (print) |
DOI: | 10.1109/IIRW56459.2022.10032763 |
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