Impact of Gaussian Grain Boundary Trap States on the Performance of the LTPS TFTs
In: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON); (2022-11-26) S. 274-278
Konferenz
Zugriff:
Titel: |
Impact of Gaussian Grain Boundary Trap States on the Performance of the LTPS TFTs
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Autor/in / Beteiligte Person: | Jaiswal, Saurabh ; Singh, Manoj Kumar ; Gosawmi, Rupam ; Goswami, Manish ; Kandpal, Kavindra |
Quelle: | IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON); (2022-11-26) S. 274-278 |
Veröffentlichung: | 2022 |
Medientyp: | Konferenz |
ISBN: | 978-1-6654-7205-0 (print) |
DOI: | 10.1109/EDKCON56221.2022.10032858 |
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