Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter
In: IEEE Transactions on Device and Materials Reliability, Jg. 23 (2023-06-01), Heft 2, S. 249-256
Online
academicJournal
Zugriff:
Titel: |
Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter
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Autor/in / Beteiligte Person: | Sehgal, H.D. ; Pratap, Y. ; Kabra, S. |
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Zeitschrift: | IEEE Transactions on Device and Materials Reliability, Jg. 23 (2023-06-01), Heft 2, S. 249-256 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 1530-4388 (print) ; 1558-2574 (print) |
DOI: | 10.1109/TDMR.2023.3255407 |
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