Predictable ESD Criteria with Proposed Comparison Diagram between TLP and HBM ESD for Various Device Technologies and Different Substrates
In: 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM); (2023-03-07) S. 1-3
Konferenz
Zugriff:
Titel: |
Predictable ESD Criteria with Proposed Comparison Diagram between TLP and HBM ESD for Various Device Technologies and Different Substrates
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Autor/in / Beteiligte Person: | Lee, Hyeokjae ; Kim, Dong-Sung ; Noh, Jae-Young ; Kim, Youngboo ; Park, Jisun ; Shin, Hyungsoon |
Quelle: | 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM); (2023-03-07) S. 1-3 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-3252-0 (print) |
DOI: | 10.1109/EDTM55494.2023.10102935 |
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