Auto-labelling of Bug Report using Natural Language Processing
In: IEEE 8th International Conference for Convergence in Technology (I2CT); (2023-04-07) S. 1-7
Konferenz
Zugriff:
Titel: |
Auto-labelling of Bug Report using Natural Language Processing
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Autor/in / Beteiligte Person: | Patil, Avinash ; Jadon, Aryan |
Quelle: | IEEE 8th International Conference for Convergence in Technology (I2CT); (2023-04-07) S. 1-7 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-3398-5 (print) ; 979-8-3503-3401-2 (print) ; 979-8-3503-3399-2 (print) ; 979-8-3503-3400-5 (print) |
DOI: | 10.1109/I2CT57861.2023.10126470 |
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