A 0.4-V 8400-μm2 Voltage Reference in 65-nm CMOS Exploiting Well-Proximity Effect
In: IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 70 (2023-10-01), Heft 10, S. 3822-3826
Online
academicJournal
Zugriff:
Titel: |
A 0.4-V 8400-μm2 Voltage Reference in 65-nm CMOS Exploiting Well-Proximity Effect
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Autor/in / Beteiligte Person: | Che, C. ; Lei, K. ; Martins, R.P. ; Mak, P. |
Link: | |
Zeitschrift: | IEEE Transactions on Circuits and Systems II: Express Briefs, Jg. 70 (2023-10-01), Heft 10, S. 3822-3826 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 1549-7747 (print) ; 1558-3791 (print) |
DOI: | 10.1109/TCSII.2023.3289500 |
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