An Error-Resilient RISC-V Microprocessor With a Fully Integrated DC–DC Voltage Regulator for Near-Threshold Operation in 28-nm CMOS
In: IEEE Journal of Solid-State Circuits, Jg. 58 (2023-11-01), Heft 11, S. 3275-3285
Online
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Zugriff:
Titel: |
An Error-Resilient RISC-V Microprocessor With a Fully Integrated DC–DC Voltage Regulator for Near-Threshold Operation in 28-nm CMOS
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Autor/in / Beteiligte Person: | Wu, B. ; Chen, W. ; Liu, T. |
Link: | |
Zeitschrift: | IEEE Journal of Solid-State Circuits, Jg. 58 (2023-11-01), Heft 11, S. 3275-3285 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 0018-9200 (print) ; 1558-173X (print) |
DOI: | 10.1109/JSSC.2023.3287360 |
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