Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs
In: IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits); (2023-06-11) S. 1-2
Konferenz
Zugriff:
Titel: |
Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs
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Autor/in / Beteiligte Person: | Chen, W. C. ; Chen, S. H. ; Veloso, A. ; Serbulova, K. ; Hellings, G. ; Groeseneken, G. |
Quelle: | IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits); (2023-06-11) S. 1-2 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 978-4-86348-806-9 (print) |
ISSN: | 2158-9682 (print) |
DOI: | 10.23919/VLSITechnologyandCir57934.2023.10185389 |
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