A Thru-Reflect-Series-Resistance (TRS) Calibration for Cryogenic Device Characterization in 40-nm CMOS Technology
In: IEEE/MTT-S International Microwave Symposium - IMS 2023; (2023-06-11) S. 1203-1206
Konferenz
Zugriff:
Titel: |
A Thru-Reflect-Series-Resistance (TRS) Calibration for Cryogenic Device Characterization in 40-nm CMOS Technology
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Autor/in / Beteiligte Person: | Chen, Yi-Ting ; Huang, Ian ; Lin, Min-Jui ; Chuang, Shu-Yan ; Ho, Hua Ling ; Hsu, Kai-Syang ; Lin, Pin-Yu ; Chen, Sih-Ying ; Lu, Liang-Hung ; Chen, Shih-Yuan ; Li, Jiun-Yun ; Chien, Jun-Chau |
Quelle: | IEEE/MTT-S International Microwave Symposium - IMS 2023; (2023-06-11) S. 1203-1206 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-4764-7 (print) |
ISSN: | 2576-7216 (print) |
DOI: | 10.1109/IMS37964.2023.10188078 |
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