DCP-Net: The Defect Detection Method of Industrial Product based on Dual Collaborative Paths
In: International Joint Conference on Neural Networks (IJCNN); (2023-06-18) S. 1-8
Konferenz
Zugriff:
Titel: |
DCP-Net: The Defect Detection Method of Industrial Product based on Dual Collaborative Paths
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Autor/in / Beteiligte Person: | Zhang, Zekai ; Zhou, Mingle ; Wan, Honglin ; Li, Min ; Li, Gang |
Quelle: | International Joint Conference on Neural Networks (IJCNN); (2023-06-18) S. 1-8 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 978-1-6654-8867-9 (print) |
ISSN: | 2161-4407 (print) |
DOI: | 10.1109/IJCNN54540.2023.10191285 |
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