High Performance EDA and LDA Analysis: An Application for Wheat Yield Estimation
In: 3rd International Conference on Advances in Computing, Communication, Embedded and Secure Systems (ACCESS); (2023-05-18) S. 163-167
Konferenz
Zugriff:
Titel: |
High Performance EDA and LDA Analysis: An Application for Wheat Yield Estimation
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Autor/in / Beteiligte Person: | Kumar, Deepak ; Kumar, Yash ; Kukreja, Vinay ; Bansal, Ankit ; Bhattacherjee, Abhishek |
Quelle: | 3rd International Conference on Advances in Computing, Communication, Embedded and Secure Systems (ACCESS); (2023-05-18) S. 163-167 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-4616-9 (print) |
DOI: | 10.1109/ACCESS57397.2023.10200446 |
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