Feature Clustering for Open-Set Recognition in LCD Manufacturing
In: IEEE Transactions on Instrumentation and Measurement, Jg. 72 (2023), S. 1-12
Online
academicJournal
Zugriff:
Titel: |
Feature Clustering for Open-Set Recognition in LCD Manufacturing
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Autor/in / Beteiligte Person: | Cursi, F. ; Wittstamm, M. ; Sung, W.L. ; Roy, A. ; Zhang, C. ; Drescher, B. |
Link: | |
Zeitschrift: | IEEE Transactions on Instrumentation and Measurement, Jg. 72 (2023), S. 1-12 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 0018-9456 (print) ; 1557-9662 (print) |
DOI: | 10.1109/TIM.2023.3308248 |
Sonstiges: |
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