Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology
In: IEEE Transactions on Nuclear Science, Jg. 71 (2024-04-01), Heft 4, S. 793-801
Online
academicJournal
Zugriff:
Titel: |
Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology
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Autor/in / Beteiligte Person: | Shen, F. ; Chen, J. ; Chi, Y. ; Liang, B. ; Sun, H. ; Wen, Y. ; Guo, H. ; Wang, X. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 71 (2024-04-01), Heft 4, S. 793-801 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) ; 1558-1578 (print) |
DOI: | 10.1109/TNS.2023.3322594 |
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