Fully Integrated Built-In Self Test of Millimeter-Wave LNA based on Avalanche Noise Diodes in 130 nm SiGe BiCMOS Technology
In: 18th European Microwave Integrated Circuits Conference (EuMIC); (2023-09-18) S. 374-377
Konferenz
Zugriff:
Titel: |
Fully Integrated Built-In Self Test of Millimeter-Wave LNA based on Avalanche Noise Diodes in 130 nm SiGe BiCMOS Technology
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Autor/in / Beteiligte Person: | Simoncini, Guendalina ; Palazzi, Valentina ; Orecchini, Giulia ; Alimenti, Federico |
Quelle: | 18th European Microwave Integrated Circuits Conference (EuMIC); (2023-09-18) S. 374-377 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 978-2-87487-073-6 (print) |
DOI: | 10.23919/EuMIC58042.2023.10288783 |
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