Hybrid-FE-Layer FeFET With High Linearity and Endurance Toward On-Chip CIM by Array Demonstration
In: IEEE Electron Device Letters, Jg. 45 (2024-02-01), Heft 2, S. 276-279
Online
academicJournal
Zugriff:
Titel: |
Hybrid-FE-Layer FeFET With High Linearity and Endurance Toward On-Chip CIM by Array Demonstration
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Autor/in / Beteiligte Person: | Zhou, Y. ; Shao, H. ; Zhu, R. ; Luo, W. ; Huang, W. ; Shan, L. ; Huang, R. ; Tang, K. |
Link: | |
Zeitschrift: | IEEE Electron Device Letters, Jg. 45 (2024-02-01), Heft 2, S. 276-279 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0741-3106 (print) ; 1558-0563 (print) |
DOI: | 10.1109/LED.2023.3346030 |
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