Online Dark Count Rate Measurements in 150 nm CMOS SPADs Exposed to Low Neutron Fluxes
In: IEEE Transactions on Nuclear Science, Jg. 71 (2024-04-01), Heft 4, S. 698-709
Online
academicJournal
Zugriff:
Titel: |
Online Dark Count Rate Measurements in 150 nm CMOS SPADs Exposed to Low Neutron Fluxes
|
---|---|
Autor/in / Beteiligte Person: | Ratti, L. ; Brogi, P. ; Collazuol, G. ; Betta, G.-.D. ; Delgado, J.C. ; Marrocchesi, P.S. ; MInga, J. ; Morsani, F. ; Pancheri, L. ; Pino, F. ; Selva, A. ; Stolzi, F. ; Torilla, G. ; Vacchi, C. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 71 (2024-04-01), Heft 4, S. 698-709 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) ; 1558-1578 (print) |
DOI: | 10.1109/TNS.2024.3353689 |
Sonstiges: |
|