Nondestructive Spectroscopic Investigation of N-Type 4H-SiC Defects Irradiated With Low Fluence 16.5 MeV/u Ta Ions
In: IEEE Transactions on Nuclear Science, Jg. 71 (2024-02-01), Heft 2, S. 154-159
Online
academicJournal
Zugriff:
Titel: |
Nondestructive Spectroscopic Investigation of N-Type 4H-SiC Defects Irradiated With Low Fluence 16.5 MeV/u Ta Ions
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Autor/in / Beteiligte Person: | Mao, B. ; Zhao, G. ; Lv, X. ; Wang, X. ; Wei, W. ; Liu, G. ; Liu, J. ; Liu, L. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 71 (2024-02-01), Heft 2, S. 154-159 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) ; 1558-1578 (print) |
DOI: | 10.1109/TNS.2024.3359261 |
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