On-Wafer Measurement of CPW with RDL Process for Substrate Effect in W-Band
In: Asia-Pacific Microwave Conference (APMC); (2023-12-05) S. 101-103
Konferenz
Zugriff:
Titel: |
On-Wafer Measurement of CPW with RDL Process for Substrate Effect in W-Band
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Autor/in / Beteiligte Person: | Sun, Chenhong ; Sun, Liguo ; Lin, Fujiang |
Quelle: | Asia-Pacific Microwave Conference (APMC); (2023-12-05) S. 101-103 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 978-1-6654-9418-2 (print) |
DOI: | 10.1109/APMC57107.2023.10439909 |
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