Compatibility of the BSIM-CMG to the Low-Frequency Noise Simulation in Subthreshold and Linear Regions of Amorphous InZnO TFTs
In: IEEE Journal of the Electron Devices Society, Jg. 12 (2024), S. 275-280
Online
academicJournal
Zugriff:
Titel: |
Compatibility of the BSIM-CMG to the Low-Frequency Noise Simulation in Subthreshold and Linear Regions of Amorphous InZnO TFTs
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Autor/in / Beteiligte Person: | Chen, Y. ; Liu, X. ; Lei, D. ; Liu, Y. ; Chen, R. ; Ni, Y. ; Kwok, H. ; Zhong, W. |
Link: | |
Zeitschrift: | IEEE Journal of the Electron Devices Society, Jg. 12 (2024), S. 275-280 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 2168-6734 (print) |
DOI: | 10.1109/JEDS.2024.3375867 |
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