Characterization of a 28 nm CMOS Technology for Analog Applications in High Energy Physics
In: IEEE Transactions on Nuclear Science, Jg. 71 (2024-04-01), Heft 4, S. 932-940
Online
academicJournal
Zugriff:
Titel: |
Characterization of a 28 nm CMOS Technology for Analog Applications in High Energy Physics
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Autor/in / Beteiligte Person: | Traversi, G. ; Gaioni, L. ; Ratti, L. ; Re, V. ; Riceputi, E. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 71 (2024-04-01), Heft 4, S. 932-940 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) ; 1558-1578 (print) |
DOI: | 10.1109/TNS.2024.3382348 |
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