The Impact of Well-Edge Proximity Effect on PMOS Threshold Voltage in Various Submicron CMOS Technologies
In: 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); (2024-04-03) S. 37-40
Konferenz
Zugriff:
Titel: |
The Impact of Well-Edge Proximity Effect on PMOS Threshold Voltage in Various Submicron CMOS Technologies
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Autor/in / Beteiligte Person: | Grochowska, Marika ; Pleskacz, Witold A. |
Quelle: | 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); (2024-04-03) S. 37-40 |
Veröffentlichung: | 2024 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-5934-3 (print) |
ISSN: | 2473-2117 (print) |
DOI: | 10.1109/DDECS60919.2024.10508916 |
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