Cryogenic Small Dimension Effects and Design-Oriented Scalable Compact Modeling of a 65-nm CMOS Technology
In: IEEE Journal of the Electron Devices Society, Jg. 12 (2024), S. 369-378
Online
academicJournal
Zugriff:
Titel: |
Cryogenic Small Dimension Effects and Design-Oriented Scalable Compact Modeling of a 65-nm CMOS Technology
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Autor/in / Beteiligte Person: | Gatti, A. ; Tavernier, F. |
Link: | |
Zeitschrift: | IEEE Journal of the Electron Devices Society, Jg. 12 (2024), S. 369-378 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 2168-6734 (print) |
DOI: | 10.1109/JEDS.2024.3394167 |
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