An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology
In: IEEE International Reliability Physics Symposium (IRPS); (2024-04-14) S. 1-5
Konferenz
Zugriff:
Titel: |
An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology
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Autor/in / Beteiligte Person: | Oh, Sangmin ; Jeong, Taeyoung ; Yum, Junghwan ; Lim, Minhyuk ; Kim, Yoohwan ; Jeong, Bongyong ; Jo, Jeongmin ; Shim, Hyewon ; Chung, Shinyoung ; Jung, Paul |
Quelle: | IEEE International Reliability Physics Symposium (IRPS); (2024-04-14) S. 1-5 |
Veröffentlichung: | 2024 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-6976-2 (print) |
ISSN: | 1938-1891 (print) |
DOI: | 10.1109/IRPS48228.2024.10529338 |
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