On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS
In: IEEE International Reliability Physics Symposium (IRPS); (2024-04-14) S. 1-6
Konferenz
Zugriff:
Titel: |
On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS
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Autor/in / Beteiligte Person: | Kim, J. ; Loveless, T. D. ; Pew, J. ; Young, R. ; Rcising, D. ; Nour, M. ; Manos, P. ; Chambers, M. ; Barnaby, H. J. ; Neucndank, J. |
Quelle: | IEEE International Reliability Physics Symposium (IRPS); (2024-04-14) S. 1-6 |
Veröffentlichung: | 2024 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-6976-2 (print) |
ISSN: | 1938-1891 (print) |
DOI: | 10.1109/IRPS48228.2024.10529354 |
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