Characterization of 14nm CMOS Technology At Cryogenic Temperatures Using Dense Addressable Arrays
In: IEEE 42nd VLSI Test Symposium (VTS); (2024-04-22) S. 1-7
Konferenz
Zugriff:
Titel: |
Characterization of 14nm CMOS Technology At Cryogenic Temperatures Using Dense Addressable Arrays
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Autor/in / Beteiligte Person: | Robertazzi, R. ; Frank, D. ; Tien, K. ; Timmerwilke, J. ; Song, Peilin ; Friedman, Daniel |
Quelle: | IEEE 42nd VLSI Test Symposium (VTS); (2024-04-22) S. 1-7 |
Veröffentlichung: | 2024 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-6378-4 (print) |
ISSN: | 2375-1053 (print) |
DOI: | 10.1109/VTS60656.2024.10538856 |
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